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XAFS and TEM Investigation of Nanocluster Formation in 64Zn+ Ion-Implanted and Thermo-Oxidized SiO2 Film

Published Online: 2020-09-16

Published Print: 2020-12

Authors

Khramov, E. V.

Privezentsev, V. V.

Palagushkin, A. N.

Shcherbachev, K. D.

Tabachkova, N. Yu.
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Text and Data Mining valid from 2020-09-16

Version of Record valid from 2020-09-16
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Article History

Received: 17 March 2020

Accepted: 25 August 2020

First Online: 16 September 2020

Conflict of interest

: The authors declare that they have no conflict of interest.

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