Reducing the Drain Leakage Current in a Double-Gate Junctionless MOSFET Using the Electron Screening Effect
Crossref DOI link: https://doi.org/10.1007/s11664-021-08801-2
Published Online: 2021-03-03
Published Print: 2021-05
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Bavir, Mohammad
Abbasi, Abdollah http://orcid.org/0000-0001-6490-8745
Orouji, Ali Asghar
Text and Data Mining valid from 2021-03-03
Version of Record valid from 2021-03-03
Article History
Received: 3 August 2020
Accepted: 30 January 2021
First Online: 3 March 2021
Compliance with ethical standards
:
: The authors declare that they have no conflict of interest.