A Multiple-Trapping-and-Release Transport Based Threshold Voltage Model for Oxide Thin Film Transistors
Crossref DOI link: https://doi.org/10.1007/s11664-021-08907-7
Published Online: 2021-04-23
Published Print: 2021-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Desai, Mohil S.
Kandpal, Kavindra
Goswami, Rupam
Text and Data Mining valid from 2021-04-23
Version of Record valid from 2021-04-23
Article History
Received: 3 February 2021
Accepted: 25 March 2021
First Online: 23 April 2021
Conflict of interest
: The authors declare that they have no conflict of interest.