Origin and Generation Process of a Triangular Single Shockley Stacking Fault Expanding from the Surface Side in 4H-SiC PIN Diodes
Crossref DOI link: https://doi.org/10.1007/s11664-021-09186-y
Published Online: 2021-09-13
Published Print: 2021-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ota, Chiharu http://orcid.org/0000-0002-7359-0983
Nishio, Johji
Okada, Aoi
Iijima, Ryosuke
Text and Data Mining valid from 2021-09-13
Version of Record valid from 2021-09-13
Article History
Received: 30 June 2021
Accepted: 10 August 2021
First Online: 13 September 2021
Conflict of interest
: The authors declare that they have no conflicts of interest.