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Origin of Double-Rhombic Single Shockley Stacking Faults in 4H-SiC Epitaxial Layers

Crossref DOI link: https://doi.org/10.1007/s11664-022-10038-6

Published Online: 2022-10-31

Published Print: 2023-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Nishio, Johji https://orcid.org/0000-0002-9691-2308
Ota, Chiharu https://orcid.org/0000-0002-7359-0983
Iijima, Ryosuke
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Text and Data Mining valid from 2022-10-31

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Article History

Received: 19 July 2022

Accepted: 11 October 2022

First Online: 31 October 2022

Conflict of interest

: The authors declare that they have no conflict of interest.