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Changes in the Microstructure and Electrical Resistance of SnBi-Based Solder Joints during Current Stressing

Published Online: 2024-01-12

Published Print: 2024-03

Authors

Flores, Javier

Panta, Sitaram

Hadian, Faramarz

Cotts, Eric https://orcid.org/0000-0001-9899-5891
Funding

Funding for this research was provided by:

Semiconductor Research Corporation (2017-PK-2788)
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Text and Data Mining valid from 2024-01-12

Version of Record valid from 2024-01-12
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Article History

Received: 1 August 2023

Accepted: 1 December 2023

First Online: 12 January 2024

Conflict of interest

: The authors certify that they have no conflict of interest.

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