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In-Line Test Structures and Non-destructive Characterization of Electromigration-Driven Phase Evolution in Microscale Solder Joints

Published Online: 2024-04-17

Published Print: 2024-06

Authors

Jois, Chetan

Chou, Pei-En

Subbarayan, Ganesh https://orcid.org/0000-0003-0462-1130
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Text and Data Mining valid from 2024-04-17

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Article History

Received: 30 January 2024

Accepted: 11 March 2024

First Online: 17 April 2024

Conflict of interest

: The authors of the paper declare that there is no Conflict of interest regarding the publication of this paper.

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