Thermionic Injection and Contact Resistance Model for Bottom Contact Organic Field-Effect Transistors
Crossref DOI link: https://doi.org/10.1007/s11664-024-11065-1
Published Online: 2024-04-17
Published Print: 2024-06
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Saikh, Samayun
Rajan, Nikhitha
Mukherjee, Ayash Kanto https://orcid.org/0000-0002-0560-911X
Text and Data Mining valid from 2024-04-17
Version of Record valid from 2024-04-17
Article History
Received: 6 November 2023
Accepted: 22 March 2024
First Online: 17 April 2024
Conflict of interest
: The authors declare no conflict of interest.