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Defect Analysis of MBE Reactor-Grown HgCdTe on Si, GaAs, GaSb, and CZT Substrates Through the TNL-Epigrow Simulator

Published Online: 2024-04-22

Published Print: 2024-10

Authors

Saxena, P. K. https://orcid.org/0000-0003-3379-5746
Srivastava, P.

Srivastava, A.
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Text and Data Mining valid from 2024-04-22

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Article History

Received: 16 December 2023

Accepted: 27 March 2024

First Online: 22 April 2024

Conflict of interest

: The authors declare that they have no conflict of interest.

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