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Characterization of Intentional Contaminations at the HgCdTe Passivation Interface and Their Effects on Photodiode Performance

Published Online: 2024-06-06

Published Print: 2024-10

Authors

Bel, Steven https://orcid.org/0009-0006-7172-8199
Lobre, Clément

Petit, Sarah

Veillerot, Marc

Badano, Giacomo
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Text and Data Mining valid from 2024-06-06

Version of Record valid from 2024-06-06
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Article History

Received: 15 December 2023

Accepted: 22 April 2024

First Online: 6 June 2024

Conflict of interest

: The authors declare that they have no conflict of interest.

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