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Low-Energy Xe Ion Beam-Mediated Defect Engineering in Optical, Electronic, Structural, and Morphological Properties of Sputtered MoS2 Thin Films

Published Online: 2024-09-27

Published Print: 2024-12

Authors

Bharti, Aniket

Gupta, Deepika

Deepika,

Khanna, Manoj Kumar

Kumar, Rajesh
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Text and Data Mining valid from 2024-09-27

Version of Record valid from 2024-09-27
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Article History

Received: 15 March 2024

Accepted: 9 September 2024

First Online: 27 September 2024

Conflict of interest

: No potential conflict of interest was reported by the authors.

: Not applicable

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