Influence of Zr Doping on Electrical and Dielectric Properties of Spin-Coated Hafnia Films for CMOS Applications
Crossref DOI link: https://doi.org/10.1007/s11664-024-11668-8
Published Online: 2024-12-24
Published Print: 2025-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sabhya,
Kekuda, Dhananjaya
Rao, K. Mohan
Text and Data Mining valid from 2024-12-24
Version of Record valid from 2024-12-24
Article History
Received: 27 June 2024
Accepted: 5 December 2024
First Online: 24 December 2024
Declarations
:
: The authors declare that they have no conflict of interest.