Crossmark

The Effect of Oxygen Pressure During Annealing on the Morphology, Structure, and Luminescence Properties of Te-Doped ZnO Thin Films

Published Online: 2025-03-19

Published Print: 2025-05

Authors

Deng, Weijie

Liu, Hongyu https://orcid.org/0009-0007-8721-1335
Luo, Jing

Zhang, Rengang
License Information

Text and Data Mining valid from 2025-03-19

Version of Record valid from 2025-03-19
More Information

Article History

Received: 26 June 2024

Accepted: 18 February 2025

First Online: 19 March 2025

Conflict of interest

: The authors declare that they have no conflicts of interest.

Document is current