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Influence of Annealing Temperature Variations on the Structural, Morphological, Optical and Electrical Properties of Ge35Se65 Thin Films

Crossref DOI link: https://doi.org/10.1007/s11664-025-11890-y

Published Online: 2025-03-29

Published Print: 2025-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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