Enhancing High-Precision Copper Ink Deposition through DIW: Process Parameter Optimization for Electronic Applications
Crossref DOI link: https://doi.org/10.1007/s11664-025-12476-4
Published Online: 2025-10-23
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gupta, Vivek Kumar
Kumar, Narendra
Text and Data Mining valid from 2025-10-23
Version of Record valid from 2025-10-23
Article History
Received: 12 July 2025
Accepted: 6 October 2025
First Online: 23 October 2025
Conflict of interest
: The authors declare that they have no conflict of interest.