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Creep Deformation and Rupture Life Characteristics of High-Purity Aluminum for High-Power Electronic Devices

Published Online: 2024-06-27

Published Print: 2025-05

Authors

Ogawa, Fumio https://orcid.org/0000-0003-1838-1297
Osada, Norihiko

Itoh, Takamoto

Sakane, Masao
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Text and Data Mining valid from 2024-06-27

Version of Record valid from 2024-06-27
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Article History

Received: 21 November 2022

Revised: 30 March 2024

Accepted: 9 May 2024

First Online: 27 June 2024

Conflict of interest

: The authors listed on the first page agree with submissions and there are no conflicts of interest regarding grants, patents, and so on.

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