Document is current

Any future updates will be listed below

Molecular Dynamics Study of Substrate Temperature and Incident Energy Influence on the Crystallization Behavior of Alumina Thin Film Deposition Process

Crossref DOI link: https://doi.org/10.1007/s11665-024-10065-w

Published Online: 2024-09-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

About CrossMark