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Comparison of Tin and Indium Thin Film’s Structural, Morphological, Adhesion, and Electrical Properties for Ohmic Contact in HgCdTe-Based Infrared Detectors

Crossref DOI link: https://doi.org/10.1007/s11665-024-10551-1

Published Online: 2024-12-26

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Gaur, Shailendra Kumar

Murtaza, Qasim

Mishra, R. S.
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Text and Data Mining valid from 2024-12-26

Version of Record valid from 2024-12-26
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Article History

Received: 3 July 2024

Revised: 19 September 2024

Accepted: 20 October 2024

First Online: 26 December 2024

Conflict of interest

: The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper

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