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Comprehensive Assessment of Failure Mechanism of Glass-Encapsulated Pulse PiN Diode under Pulse Condition

Crossref DOI link: https://doi.org/10.1007/s11668-024-01954-2

Published Online: 2024-08-08

Published Print: 2024-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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