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A Comprehensive Failure Analysis Approach Utilizing High-Resolution Targeted Patterns (HRTP) for ATPG Diagnosis Resolution Improvement, Test Coverage Resolution, and Further Fault Localization

Crossref DOI link: https://doi.org/10.1007/s11668-024-02018-1

Published Online: 2024-09-03

Published Print: 2024-10

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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