AI-Driven Framework for Generalized Optical Inspection of Printed Circuit Board Interconnects
Crossref DOI link: https://doi.org/10.1007/s11668-025-02287-4
Published Online: 2025-09-24
Published Print: 2025-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Craig, Patrick
Pearson, Jonathan
Ghosh, Shajib
Varshney, Nitin
Koppal, Sanjeev J.
Asadizanjani, Navid
Text and Data Mining valid from 2025-09-24
Version of Record valid from 2025-09-24
Article History
Received: 14 March 2025
Revised: 13 June 2025
Accepted: 8 July 2025
First Online: 24 September 2025