Effects of Multi-axis Oscillations: A Novel Approach to Residual Stress Measurements via X-Ray Diffraction
Crossref DOI link: https://doi.org/10.1007/s11668-026-02456-z
Published Online: 2026-06-03
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Pineault, James
Taptich, Jeff
Nantais, Jeff
Belassel, Mohammed
Text and Data Mining valid from 2026-06-03
Version of Record valid from 2026-06-03
Article History
Received: 4 March 2026
Revised: 9 April 2026
Accepted: 23 April 2026
First Online: 3 June 2026