Document is current

Any future updates will be listed below

Statistical analysis of recombination properties of the boron-oxygen defect in p-type Czochralski silicon

Crossref DOI link: https://doi.org/10.1007/s11708-016-0442-6

Published Online: 2016-11-19

Published Print: 2017-03

Update policy: https://doi.org/10.1007/springer_crossmark_policy

About CrossMark