Pseudo-labeling and clustering-based active learning for imbalanced classification of wafer bin map defects
Crossref DOI link: https://doi.org/10.1007/s11760-023-02915-2
Published Online: 2023-12-22
Published Print: 2024-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Manivannan, Siyamalan
Text and Data Mining valid from 2023-12-22
Version of Record valid from 2023-12-22
Article History
Received: 12 October 2023
Revised: 18 November 2023
Accepted: 20 November 2023
First Online: 22 December 2023
Declarations
:
: The authors declare no competing interests.
: Not applicable.