TPVG-YOLO: Twined-Path Convolution and Vision-Gated Fusion for Efficient PCB Defect Detection
Crossref DOI link: https://doi.org/10.1007/s11760-025-04952-5
Published Online: 2025-11-14
Published Print: 2025-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Pan, Weichao
Wang, Xu
Lü, Chengze
Text and Data Mining valid from 2025-11-14
Version of Record valid from 2025-11-14
Article History
Received: 1 July 2025
Revised: 22 August 2025
Accepted: 1 November 2025
First Online: 14 November 2025
Declarations
:
: The authors declare no competing interests.