Image-based automated defect detection for optical masks of sun sensors
Crossref DOI link: https://doi.org/10.1007/s11760-025-05038-y
Published Online: 2026-01-16
Published Print: 2026-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ma, Baoying
Fan, Qiaoyun
Text and Data Mining valid from 2026-01-01
Version of Record valid from 2026-01-01
Article History
Received: 2 August 2025
Revised: 22 November 2025
Accepted: 6 December 2025
First Online: 16 January 2026
Declarations
:
: The authors declare no competing interests.