Novel LDNMOS embedded SCR with strong ESD robustness based on 0.5 μm 18 V CDMOS technology
Crossref DOI link: https://doi.org/10.1007/s11771-015-2555-1
Published Online: 2015-02-18
Published Print: 2015-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wang, Yang
Jin, Xiang-liang
Zhou, A-cheng
Text and Data Mining valid from 2015-02-01
