Wafer bin map inspection based on DenseNet
Crossref DOI link: https://doi.org/10.1007/s11771-021-4778-7
Published Online: 2021-09-22
Published Print: 2021-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yu, Nai-gong http://orcid.org/0000-0002-8452-4623
Xu, Qiao
Wang, Hong-lu
Lin, Jia
Text and Data Mining valid from 2021-08-01
Version of Record valid from 2021-08-01
Article History
Received: 10 June 2020
Accepted: 13 November 2020
First Online: 22 September 2021