Effects of electron beam lithography process parameters on structure of silicon optical waveguide based on SOI
Crossref DOI link: https://doi.org/10.1007/s11771-022-5152-0
Published Online: 2022-11-15
Published Print: 2022-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zheng, Yu
Gao, Piao-piao https://orcid.org/0000-0002-3124-8370
Tang, Xin
Liu, Jian-zhe
Duan, Ji-an
Text and Data Mining valid from 2022-10-01
Version of Record valid from 2022-10-01
Article History
Received: 8 March 2022
Accepted: 7 July 2022
First Online: 15 November 2022