Influence of annealing on the structural, optical and electrical properties of indium oxide films deposited on c-sapphire substrate
Crossref DOI link: https://doi.org/10.1007/s11801-016-5235-y
Published Online: 2016-01-10
Published Print: 2016-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zhao, Hong-duo
Mi, Wei
Zhang, Kai-liang
Zhao, Jin-shi
Text and Data Mining valid from 2016-01-01