Effect of electron beam evaporation process parameters on infrared refractive index of Ge film
Crossref DOI link: https://doi.org/10.1007/s11801-020-9152-8
Published Online: 2020-07-10
Published Print: 2020-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Li, Kun
Xiong, Yu-qing
Wang, Hu
Zhang, Kai-feng
Xu, Ling-mao
Li, Xue-lei
Zhou, Hui
Text and Data Mining valid from 2020-07-01
Version of Record valid from 2020-07-01
Article History
Received: 14 September 2019
Revised: 16 October 2019
First Online: 10 July 2020