Retraction Retraction dated 2017-08-01

Click to view Retraction: https://doi.org/10.1007/s11837-015-1460-2

Retraction Retraction dated 2015-05-27

Click to view Retraction: https://doi.org/10.1007/s11837-015-1460-2

RETRACTED ARTICLE: Nanocharacterization of Titanium Nitride Thin Films Obtained by Reactive Magnetron Sputtering

Crossref DOI link: https://doi.org/10.1007/s11837-015-1460-2

Published Online: 2015-05-27

Published Print: 2017-08

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