In Situ TEM Scratch Testing of Perpendicular Magnetic Recording Multilayers with a Novel MEMS Tribometer
Crossref DOI link: https://doi.org/10.1007/s11837-016-2154-0
Published Online: 2016-10-24
Published Print: 2017-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hintsala, Eric D.
Stauffer, Douglas D.
Oh, Yunje
Asif, S. A. Syed
License valid from 2016-10-24