Evidence of Silicon Band-Edge Emission Enhancement When Interfaced with SiO2:Er Films
Crossref DOI link: https://doi.org/10.1007/s11837-016-2207-4
Published Online: 2016-12-05
Published Print: 2017-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Abedrabbo, S.
Fiory, A. T.
Ravindra, N. M.
License valid from 2016-12-05