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Modified Failure Mechanism of Silicon through Excess Electrons and Holes

Crossref DOI link: https://doi.org/10.1007/s11837-020-04180-x

Published Online: 2020-04-28

Published Print: 2020-09

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Shen, Yidi

An, Qi https://orcid.org/0000-0003-4838-6232
Funding

Funding for this research was provided by:

U.S. Nuclear Regulatory Commission (NRC-HQ-84-15-G-0028)
License Information

Text and Data Mining valid from 2020-04-28

Version of Record valid from 2020-04-28
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Article History

Received: 23 February 2020

Accepted: 14 April 2020

First Online: 28 April 2020