Analysis of Li-related defects in ZnO thin films influenced by annealing ambient
Crossref DOI link: https://doi.org/10.1007/s12034-014-0619-8
Published Online: 2014-05-06
Published Print: 2014-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
WANG, BING
TANG, LIDAN
Text and Data Mining valid from 2014-02-01