Bias-dependent photo-detection of dual-ion beam sputtered MgZnO thin films
Crossref DOI link: https://doi.org/10.1007/s12034-015-1131-5
Published Online: 2016-02-05
Published Print: 2016-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
PANDEY, SAURABH KUMAR
MUKHERJEE, SHAIBAL
Text and Data Mining valid from 2016-02-01