Crossmark

Effect of europium content on physical properties of In2O3 thin films for sensitivity and optoelectronic applications

Crossref DOI link: https://doi.org/10.1007/s12034-016-1203-1

Published Online: 2016-06-07

Published Print: 2016-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

KAMOUN, O

BOUKHACHEM, A

MRABET, C

YUMAK, A

PETKOVA, P

BOUBAKER, K

AMLOUK, M
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License valid from 2016-06-01