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Investigation of metallic nanoparticles adsorbed on the QCM sensor by SEM and AFM techniques

Crossref DOI link: https://doi.org/10.1007/s12034-018-1600-8

Published Online: 2018-05-17

Published Print: 2018-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Bucurica, Ioan Alin https://orcid.org/0000-0001-8346-7121
Popescu, Ion V https://orcid.org/0000-0002-4589-7208
Radulescu, Cristiana https://orcid.org/0000-0003-1208-7732
Cimpoca, Gheorghe Valerica

Dulama, Ioana-Daniela https://orcid.org/0000-0003-0200-0867
Teodorescu, Sofia https://orcid.org/0000-0001-6601-5895
Gurgu, Ion Valentin https://orcid.org/0000-0003-0489-127X
Let, Dorin Dacian https://orcid.org/0000-0002-3662-323X
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Text and Data Mining valid from 2018-05-17
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Article History

Received: 30 June 2017

Accepted: 28 October 2017

First Online: 17 May 2018