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A comparative study on dielectric behaviours of Au/(Zn-doped PVA)/n-4H-SiC (MPS) structures with different interlayer thicknesses using impedance spectroscopy methods

Crossref DOI link: https://doi.org/10.1007/s12034-018-1602-6

Published Online: 2018-05-23

Published Print: 2018-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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