Defect characterization of Ga4Se3S layered single crystals by thermoluminescence
Crossref DOI link: https://doi.org/10.1007/s12043-015-1081-x
Published Online: 2015-11-17
Published Print: 2016-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
ISIK, M
DELICE, S
GASANLY, N
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