Property elucidation of vacuum-evaporated zinc telluride thin film towards optoelectronic devices
Crossref DOI link: https://doi.org/10.1007/s12046-017-0717-6
Published Online: 2017-08-31
Published Print: 2017-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ahamed, J U
Begum, N P
Khan, M N I
License valid from 2017-08-31