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Modelling and mitigation of single-event upset in CMOS voltage-controlled oscillator

Crossref DOI link: https://doi.org/10.1007/s12046-018-0945-4

Published Online: 2018-09-27

Published Print: 2018-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Shukla, Satyam https://orcid.org/0000-0002-3840-0849
Gill, S S

Jatana, H S

Nehru, Varun

Kaur, Navneet
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Text and Data Mining valid from 2018-09-27
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Article History

Received: 8 November 2017

Revised: 7 March 2018

Accepted: 6 April 2018

First Online: 27 September 2018