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Exploration and analysis of n-FinFET implementing stacked high-K at 08 nm gate length

Crossref DOI link: https://doi.org/10.1007/s12046-023-02380-0

Published Online: 2023-12-22

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Nanda, Swagat https://orcid.org/0000-0002-7894-0890
Kumari, Sapna

Dhar, Rudra Sankar https://orcid.org/0000-0002-6571-3808
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Text and Data Mining valid from 2023-12-22

Version of Record valid from 2023-12-22
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Article History

Received: 14 July 2023

Revised: 24 October 2023

Accepted: 27 October 2023

First Online: 22 December 2023