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X-ray diffraction measurement of residual stress in sol-gel grown lead zirconate titanate thick films on nickel-based super alloy substrate

Crossref DOI link: https://doi.org/10.1007/s12206-015-0131-0

Published Online: 2015-02-15

Published Print: 2015-02

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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