Storage reliability estimation of one-shot systems using accelerated destructive degradation data
Crossref DOI link: https://doi.org/10.1007/s12206-016-0908-9
Published Online: 2016-10-19
Published Print: 2016-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Son, Young Kap
Kwon, Taesoo
License valid from 2016-10-01