Vibration suppression of atomic-force microscopy cantilevers covered by a piezoelectric layer with tensile force
Crossref DOI link: https://doi.org/10.1007/s12206-018-0811-7
Published Online: 2018-09-14
Published Print: 2018-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Korayem, M. H.
Alipour, A.
Younesian, D.
Text and Data Mining valid from 2018-09-01
Article History
Received: 9 March 2018
Revised: 13 May 2018
Accepted: 28 May 2018
First Online: 14 September 2018