Quantitative measurements of nanoparticle layer thicknesses near the contact line region after droplet drying-out
Crossref DOI link: https://doi.org/10.1007/s12206-019-0153-0
Published Online: 2019-02-26
Published Print: 2019-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shin, Dong Hwan
Kim, Dae Yun
Choi, Chang Kyoung
Lee, Seong Hyuk
Text and Data Mining valid from 2019-02-01
Article History
Received: 13 September 2018
Revised: 24 October 2018
Accepted: 25 October 2018
First Online: 26 February 2019