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Optimized VMD and novel ECK-Venn based approach to IMF selection for chatter and tool wear classification

Crossref DOI link: https://doi.org/10.1007/s12206-024-1209-3

Published Online: 2025-01-06

Published Print: 2025-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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