Toward negligible charge loss in charge injection memories based on vertically integrated 2D heterostructures
Crossref DOI link: https://doi.org/10.1007/s12274-016-1118-6
Published Online: 2016-06-23
Published Print: 2016-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Qiu, Dongri
Lee, Dong Uk
Lee, Kyoung Su
Pak, Sang Woo
Kim, Eun Kyu
License valid from 2016-06-23